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Journal

IEEE Transactions on Electron Devices

Scopus

ISSN 0018-9383 · Institute of Electrical and Electronics Engineers · 1 articles in the index

  1. Journal Article Full text

    Review and Outlook on GaN and SiC Power Devices: Industrial State-of-the-Art, Applications, and Perspectives

    Matteo Buffolo; Davide Favero; A. Marcuzzi et al.

    IEEE Transactions on Electron Devices · 2024 · English · OpenAlex Scopus

    We present a comprehensive review and outlook of silicon carbide (SiC) and gallium nitride (GaN) transistors available on the market for current and next-generation power electronics. Material properties and structural differences among GaN and SiC devices are first discussed. Based on the analysis…